Laser machining method and chip

ABSTRACT

While reliably cutting an object to be processed, the strength of the resulting chips is improved. An object to be processed  1  is irradiated with laser light L, so as to form modified regions  17, 27, 37, 47  extending along lines to cut  5  and aligning in the thickness direction in the object  1 . Here, modified regions  17  are formed such that modified region formed parts  17   a  and modified region unformed parts  17   b  alternate along the lines, and modified regions  47  are formed such that modified region formed parts  47   a  and modified region unformed parts  47   b  alternate along the lines. This can inhibit formed modified regions  7  from lowering the strengths on the rear face  21  side and front face  3  side of chips obtained by cutting. On the other hand, modified regions  27, 37  located between the modified regions  17, 47  are formed continuously from one end side of the lines  5  to the other end side thereof, whereby the cuttability of the object  1  can be secured reliably.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of U.S. application Ser. No.13/387,261, filed Jan. 26, 2012, the entire contents of which isincorporated herein by reference. U.S. application Ser. No. 13/387,261is a 35 U.S.C. §371 of PCT/JP2010/063879 filed Aug. 17, 2010, whichclaims the benefit of Japanese Patent Application No. 2009-192340, filedAug. 21, 2009.

TECHNICAL FIELD

The present invention relates to a laser processing method for cuttingan object to be processed into a plurality of chips, and a chip obtainedby using this laser processing method.

BACKGROUND ART

Known as a conventional laser processing method is one irradiating anobject to be processed with laser light while locating a convergingpoint within the object, so as to form a modified region to become acutting start point in the object along a line to cut (see, for example,Patent Literature 1). After forming the modified region, such a laserprocessing method cuts the object into a plurality of chips along theline to cut from the modified region acting as a cutting start point.

CITATION LIST Patent Literature

-   Patent Literature 1: Japanese Patent Application Laid-Open No.    2003-338467

SUMMARY OF INVENTION Technical Problem

There are cases where the chips obtained by using the above-mentionedlaser processing method are employed in an environment where a shock maybe applied thereto, whereby they are required to improve their strengthsuch as bending strength. It is also desired for the above-mentionedlaser processing method to be able to cut the object reliably.

It is therefore an object of the present invention to provide a laserprocessing method which can reliably cut an object to be processed andimprove the strength of the resulting chips, and a chip obtained byusing this laser processing method.

Solution to Problem

For achieving the above-mentioned object, the inventors conducteddiligent studies and, as a result, have found that there is a case wherethe strength of the resulting chips is lowered by modified regionsformed. The inventors have further found that, since one and the othermain face sides of chips are likely to become bases for breakages(cracks), for example, modified regions formed on one and the other mainface sides have an influence on the lowering of strength in particular.It leads to an idea that the strength of chips can effectively beimproved if the strengths on one and the other main face sides of thechips can be inhibited from being lowered by modified regions, therebycompleting the present invention.

That is, the laser processing method in accordance with the presentinvention is a laser processing method of irradiating a sheet-likeobject to be processed with laser light while locating a convergingpoint within the object, so as to form a modified region to become acutting start point in the object along a line to cut; the methodcomprising a modified region forming step of forming along the line atleast a first modified region located on one main face side of theobject, a second modified region located on the other main face side ofthe object, and a third modified region located between the first andsecond modified regions, the first to third regions aligning in athickness direction of the object; the modified region forming stepincluding the steps of forming the first modified region such that partsformed with and without the first modified region alternate along theline, forming the second modified region such that parts formed with andwithout the second modified region alternate along the line, and formingthe third modified region such that a part formed with the thirdmodified region exists from one end side to the other end side along theline in the object.

In the laser processing method in accordance with the present invention,parts formed with and without the first modified region on one main faceside are formed so as to alternate along the line to cut, while partsformed with and without the second modified region on the other mainface side are formed so as to alternate along the line to cut. This caninhibit the strengths on one and the other main face sides of theresulting chips from being lowered by the modified regions formed. Onthe other hand, the part formed with the third modified region locatedbetween the first and second modified regions is formed so as to existfrom one end side of the line to the other end side thereof, whereby thecuttability of the object is secured reliably. Hence, the presentinvention can cut the object reliably and improve the strength of theresulting chips.

Preferably, the parts formed with the first and second modified regionsare formed so as to exist in a predetermined part extending along theline and passing a surface to cut the object. In this case, the firstand second modified regions can be formed in parts corresponding toedges of the resulting chips. This can secure the straightforwardness ofthe cut surface.

Here, there is a case where a plurality of functional devices arearranged in a matrix on the main face of the object, the line is setlike a grid between the plurality of functional devices, and when theobject is seen from a lateral side, the parts formed with the first andsecond modified regions are formed so as to exist in a partcorresponding to between the plurality of functional devices, while theparts formed without the modified regions are formed so as to exist in apart corresponding to a center part of the functional device.

Preferably, the plurality of functional devices each present anelongated form and are arranged in such a matrix as to have the samelongitudinal direction, while the parts formed with and without thefirst and second modified regions alternate along a part of the lineextending along the longitudinal direction. When the resulting chipshave an elongated form, they are required to improve the bendingstrength in their longitudinal direction (i.e., breakability at the timewhen a force is applied to a chip held by both longitudinal end partsthereof) in particular. In this regard, the parts formed with andwithout the first and second modified regions alternating along thelongitudinal line to cut can enhance the bending strength in thelongitudinal direction in particular, whereby the above-mentioned effectof improving the strength of chips can be exhibited effectively.

The method may further comprise a cutting step of cutting the objectalong the line from the first, second, and third modified regions as acutting start point.

The chip in accordance with the present invention is a chip having sidefaces substantially parallel to a thickness direction; wherein at leastone of the side faces is formed with at least first, second, and thirdmodified regions aligning in the thickness direction and extending in adirection intersecting the thickness direction; wherein, on the one sideface, the first modified region is located on one main face side of thechip and formed in one and the other end parts in the intersectingdirection; wherein, on the one side face, the second modified region islocated on the other main face side of the chip and formed on the oneand the other end parts; and wherein, on the one side face, the thirdmodified region is located between the first and second modified regionsand formed so as to exist from the one end part to the other end part.

The chip of the present invention can be obtained by using theabove-mentioned laser processing method in accordance with the presentinvention. Here, the first modified region on one main face side and thesecond modified region on the other main face side are formed along theintersecting direction in one and the other end parts in theintersecting direction. This can inhibit the strengths on one and theother main face sides of the chip from being lowered by modified regionsformed and improve the strength of the chip.

Advantageous Effects of Invention

The present invention can reliably cut an object to be processed andimprove the strength of the resulting chips.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a schematic structural diagram of a laser processing apparatusfor performing the laser processing method in accordance with anembodiment;

FIG. 2 is a plan view of an example of objects to be processed for whicha modified region is formed;

FIG. 3 is a sectional view of the object taken along the line III-III ofFIG. 2;

FIG. 4 is a plan view of the object after laser processing;

FIG. 5 is a sectional view of the object taken along the line V-V ofFIG. 4;

FIG. 6 is a sectional view of the object taken along the line VI-VI ofFIG. 4;

FIG. 7 is a plan view illustrating an object to be processed by thelaser processing method of a first embodiment;

FIG. 8 is a sectional flow diagram taken along the line VIII-VIII ofFIG. 7 for explaining the laser processing method of the firstembodiment;

FIG. 9 is a sectional flow diagram for illustrating a sequel to FIG. 8;

FIG. 10 is a sectional flow diagram for illustrating a sequel to FIG. 9;

FIG. 11 is a perspective view illustrating a chip obtained by the laserprocessing method of the first embodiment;

FIG. 12 is an enlarged photographic view illustrating a side face of thechip obtained by the laser processing method of the first embodiment;

FIG. 13 is a chart representing results of bending strength tests forthe chip of FIG. 12;

FIG. 14 is a plan view illustrating an object to be processed by thelaser processing method of a second embodiment;

FIG. 15 is a sectional flow diagram taken along the line XV-XV of FIG.14 for explaining the laser processing method of the second embodiment;

FIG. 16 is a sectional flow diagram taken along the line XVI-XVI of FIG.14 for illustrating a sequel to FIG. 15;

FIG. 17 is a sectional flow diagram for illustrating a sequel to FIG.16;

FIG. 18 is a sectional flow diagram for illustrating a sequel to FIG.17; and

FIG. 19 is a perspective view illustrating a chip obtained by the laserprocessing method of the second embodiment.

DESCRIPTION OF EMBODIMENTS

In the following, preferred embodiments of the present invention will beexplained in detail with reference to the drawings. In the drawings, thesame or equivalent constituents will be referred to with the same signswhile omitting their overlapping descriptions. The terms “left” and“right” are based on the states illustrated in the drawings and usedonly for convenience.

The laser processing apparatus in accordance with an embodimentirradiates an object to be processed with laser light while locating aconverging point within the object, so as to form a modified region inthe object. Therefore, the forming of the modified region by the laserprocessing apparatus will firstly be explained with reference to FIGS. 1to 6.

As illustrated in FIG. 1, a laser processing apparatus 100 comprises alaser light source 101 for causing laser light L to oscillate in apulsating manner, a dichroic mirror 103 arranged such as to change thedirection of the optical axis (optical path) of the laser light L by90°, and a condenser lens 105 for converging the laser light L. Thelaser processing apparatus 100 also comprises a support table 107 forsupporting an object to be processed 1 which is irradiated with thelaser light L converged by the condenser lens 105, a stage 111 formoving the support table 107 along X, Y, and Z axes, a laser lightsource controller 102 for regulating the laser light source 101 in orderto adjust the output, pulse width, and the like of the laser light L,and a stage controller 115 for regulating movements of the stage 111.

In the laser processing apparatus 100, the laser light L emitted fromthe laser light source 101 changes the direction of its optical axis by90° with the dichroic mirror 103 and then is converged by the condenserlens 105 into the object 1 mounted on the support table 107. At the sametime, the stage 111 is shifted, so that the object 1 moves relative tothe laser light L along a line to cut 5. This forms a modified region tobecome a cutting start point in the object 1 along the line 5.

A semiconductor material, a piezoelectric material, or the like is usedfor the object 1, in which the line 5 for cutting the object 1 is set asillustrated in FIG. 2. The line 5 is a virtual line extending straight.When forming a modified region within the object 1, the laser light L isrelatively moved along the line 5 (i.e., in the direction of arrow A inFIG. 2) while locating a converging point P within the object 1 asillustrated in FIG. 3. This forms a modified region 7 within the object1 along the line 5 as illustrated in FIGS. 4 to 6, whereby the modifiedregion 7 formed along the line 5 becomes a cutting start region 8.

The converging point P is a position at which the laser light L isconverged. The line 5 may be curved instead of being straight and may bea line actually drawn on the front face 3 of the object 1 without beingrestricted to the virtual line. The modified region 7 may be formedeither continuously or intermittently either in rows or dots. It will besufficient if the modified region 7 is formed at least partly within theobject 1 so as to become a cutting start point. There are cases wherefractures are formed from the modified region 7 acting as a start point,and the fractures and modified region 7 may be exposed at outer surfaces(the front face, rear face, and outer peripheral face) of the object 1.

Here, the laser light L is absorbed in particular in the vicinity of theconverging point within the object 1 while being transmittedtherethrough, whereby the modified region 7 is formed in the object 1(internal absorption type laser processing). Therefore, the front face 3of the object 1 hardly absorbs the laser light L and thus does not melt.In the case of forming a removing part such as a hole or groove bymelting it away from the front face 3, the processing region graduallyprogresses from the front face 3 side to the rear face side in general(surface absorption type laser processing).

The modified region formed by the laser processing apparatus inaccordance with this embodiment means regions whose physicalcharacteristics such as density, refractive index, and mechanicalstrength have attained states different from those of theirsurroundings. Examples of the modified region include molten processedregions, crack regions, dielectric breakdown regions, refractive indexchanged regions, and their mixed regions. Further examples of themodified region include an area where the density of the modified regionhas changed from that of an unmodified region in the material of theobject and an area formed with a lattice defect (which can collectivelybe referred to as a high-density transitional region).

The molten processed regions, refractive index changed regions, areaswhere the modified region has a density different from that of theunmodified region, and areas formed with a lattice defect may furtherincorporate a fracture (cut or microcrack) therewithin or at aninterface between the modified and unmodified regions. The incorporatedfracture may be formed over the whole surface of the modified region orin only a part or a plurality of parts thereof. Examples of the object 1include those containing or constituted by any of silicon, glass,LiTaO₃, and sapphire (Al₂O₃).

First Embodiment

The laser processing method in accordance with the first embodiment ofthe present invention will now be explained in detail.

In the object 1 to be processed by the laser processing method of thisembodiment, a plurality of functional devices 15 are formed on its frontface 3 as illustrated in FIG. 7. Examples of the functional devices 15include semiconductor operating layers formed by crystal growth,light-receiving devices such as photodiodes, light-emitting devices suchas laser diodes, and circuit devices formed as integrated circuits. Anumber of functional devices 15, each of which is formed as arectangular driver IC (Integrated Circuit) here, are arranged in amatrix.

For example, a substantially disk-shaped silicon substrate is used asthe object 1, in which grid-like lines to cut 5 passing between thefunctional devices 15 adjacent to each other are set. That is, the lines5 include lines to cut 5 a extending along one direction and lines tocut 5 b extending along a direction orthogonal to (intersecting) thelines 5 a.

The laser processing method of this embodiment forms four rows ofmodified regions 17, 27, 37, 47 extending along the lines 5 and aligningin the thickness direction in this order from the rear face 21 side tothe front face 3 side. The object 1 is cut into a plurality of chipsfrom the modified regions 17, 27, 37, 47 acting as cutting start points.Specifically, as illustrated in FIG. 8( a), the object 1 having anexpandable tape 22 attached to its rear face 21 is firstly mounted onthe support table 107 (see FIG. 1).

Subsequently, the object 1 is irradiated with the laser light L, whileusing the front face 3 of the object 1 as a laser light entrance surfaceand locating the converging point P on the rear face 21 side of theobject 1. At the same time, the laser light L is relatively moved(scanned) along the lines 5 a. This forms modified regions 17 located onthe rear face 21 side of the object 1 within the object 1 along thelines 5 a as illustrated in FIG. 8( b).

Here, the laser light source controller 102 regulates the ON/OFF of theemission of the laser light L, so as to form the modified regions 17such that modified region formed parts 17 a which are parts formed withthe modified regions 17 and modified region unformed parts 17 b whichare parts formed without the modified regions 17 alternate along thelines 5 a. In other words, the modified region formed parts 17 a areintermittently formed along the lines 5 a.

More specifically, when the object 1 is seen from a lateral side, themodified region formed parts 17 a are formed so as to exist in parts(sections) corresponding to between a plurality of functional devices15. That is, as parts corresponding to edges of chips after cutting, themodified region formed parts 17 a are formed so as to be located inpredetermined parts extending by predetermined lengths along the lines 5a and passing surfaces to cut S. On the other hand, the modified regionunformed parts 17 b are formed so as to exist in parts (sections)corresponding to the center parts of the functional devices 15.

Next, while irradiating the object 1 such that the converging point P islocated closer to the front face 3 than are the modified regions 17, thelaser light L is relatively moved along the lines 5 a. This forms themodified regions 27 located at substantially the center in the thicknessdirection of the object 1 continuously within the object 1 along thelines 5 a as illustrated in FIG. 9( a). That is, modified region formedparts 27 a which are parts formed with the modified regions 27 arecontinuously formed so as to exist from one end side of the object 1 tothe other end side thereof in the direction extending along the lines 5a.

Subsequently, while irradiating the object 1 such that the convergingpoint P is located closer to the front face 3 than are the modifiedregions 27, the laser light L is relatively moved along the lines 5 a.This forms modified regions 37, located at substantially the center inthe thickness direction of the object 1, similar to the modified regions27 within the object 1 continuously along lines 5 a.

Next, while irradiating the object 1 such that the converging point P islocated on the front face 3 side of the object 1, the laser light L isrelatively moved. This forms modified regions 47 located on the frontface 3 side of the object 1 within the object 1 along the lines 5 a asillustrated in FIG. 9( b). The modified regions 47 are formed such thatmodified region formed parts 47 a which are parts formed with themodified regions 47 and modified region unformed parts 47 b which areformed without the modified regions 47 alternate along the lines 5 a.

Then, as in the forming of the modified regions 17, 27, 37, 47 along thelines 5 a mentioned above, the modified regions 17, 27, 37, 47 areformed along the lines 5 b. Finally, as illustrated in FIG. 10, theexpandable tape 22 is expanded, so as to cut the object 1 into thefunctional devices 15 along the lines 5 from the modified regions 17,27, 37, 47 acting as cutting start points. This yields a plurality ofsemiconductor chips C1 each having a chip size of 5 mm×5 mm, forexample.

When the object 1 is thin, for example, the forming of the modifiedregions 37 may be omitted. When the object 1 is thick, for example, oneor a plurality of modified regions similar to the modified regions 27may further be formed between the modified regions 37, 47. That is,modified regions may appropriately be formed according to the thicknessof the object 1 such that at least one row of modified regions 27 isformed between the modified regions 17, 47.

FIG. 11 is a perspective view illustrating a chip obtained by the laserprocessing method of this embodiment. As illustrated in FIG. 11, thechip C1 presents a square form when seen from the front face 3 and hasthe functional device 15 formed on the front face 3. In each of sidefaces 51 of the chip C1, four rows of modified regions 17, 27, 37, 47aligning in the thickness direction are formed in this order from therear face 21 side to the front face 3 side. Each of the modified regions17, 27, 37, 47 extends in each side face 51 in a direction (hereinaftersimply referred to as “orthogonal direction”) orthogonal to thethickness direction.

The modified regions 17, 47 are located closest to the rear and frontfaces 21, 3, respectively. The modified regions 17, 47 are formed inleft and right end parts (one and the other end parts) in the orthogonaldirection in each side face 51 which are etch parts of the chip C1. Themodified regions 17, 47 here are provided only in parts corresponding toareas which are free of the functional device 15 in the front face 3when seen from the side face 51. That is, the part corresponding to thearea provided with the functional device 15 in the front face 3 is freeof the modified regions 17, 47. The modified regions 27, 37 are locatedbetween the modified regions 17, 47 and formed continuously from theleft end part of the chip C1 to the right end part thereof in theorthogonal direction in each side face 51.

In this embodiment, the modified regions 17 are formed such that themodified region formed parts 17 a and modified region unformed parts 17b alternate along the lines to cut as in the foregoing. The modifiedregions 47 are also formed such that the modified region formed parts 47a and modified region unformed parts 47 b alternate along the lines tocut. This can inhibit the strengths on the rear face 21 side and frontface 3 side of the chip C1, which are likely to become base points forbreakages, from being lowered by the forming of the modified regions. Onthe other hand, the modified regions 27, 37 located between the modifiedregions 17, 47 are continuously formed from one end side of the lines tocut 5 to the other end side thereof, whereby the cuttability of theobject 1 can be secured reliably. As a result, while the object 1 can becut reliably, the bending strength of the chips C1 obtained by cuttingcan be improved.

That is, in this embodiment, the modified regions 17, 47 are formedintermittently such as to provide unformed parts at the positionsclosest to the rear and front faces 21, 3 of the object 1, while themodified regions 27, 37 are formed continuously such as to be free ofunformed parts at positions held between the modified regions 17, 47.This can reduce the parts formed with the modified regions 7 (form theminimum modified regions 7 required for cutting), while keeping thecuttability of the object 1, thereby enhancing the strength such asbending strength of the chip C1 and its rigidity.

As mentioned above, the modified region formed parts 17 a, 47 a areformed so as to be located in parts corresponding to between a pluralityof functional devices 15 when seen from a lateral side and exist inpredetermined parts intersecting the surfaces S to cut the object 1. Asa consequence, the modified regions 17, 47 are formed in edge parts(i.e., left and right end parts in the side faces 51) of the resultingchips C1. This makes it possible to secure the straightforwardness ofthe side faces 51 of the chips C1, which are cut surfaces, so as toinhibit so-called skirts from occurring and improve the quality.

FIG. 12 is an enlarged photographic view illustrating a side face of thechip obtained by the laser processing method of this embodiment. Thedepicted chip C1 has a size of 5 mm×5 mm with a thickness of 200 μm. InFIG. 12, (a), (b), and (c) illustrate the left end, center, and rightend parts of the chip C1 in the state where the front face 3 is on theupper side.

When manufacturing the chip C1, three rows of modified regions 17, 27,47 are formed in the object 1. Specifically, the object 1 is irradiatedwith the laser light L at a power of 0.5 W while locating the convergingpoint P at a position of 180 μm from the front face 3 so as to form themodified region 17, at a power of 0.72 W while locating the convergingpoint P at a position of 120 μm from the front face 3 so as to form themodified region 27, and at a power of 0.5 W while locating theconverging point P at a position of 60 μm from the front face 3 so as toform the modified region 47.

As illustrated in FIG. 12, it is seen that the modified region 17extending laterally near the rear face 21, the modified region 27extending laterally at the center part in the thickness direction, andthe modified region 47 extending laterally near the front face 3 areformed as three rows aligning in the thickness direction in the sideface 51 of the chip C1. It is also seen that the modified regions 17, 47are formed in the left and right end parts alone and not in the centerpart in the lateral direction, while the modified region 17 is formedcontinuously so as to exist from the left end part to the right endpart.

In particular, the modified region 17 formed by the first scan is denserthan the modified region 47 formed by the subsequent scan (i.e., themodified region 47 is sparser than the modified region 17). This seemsto be because fractures and the like generated from the modified region17 upon forming the latter affect the making of the modified region 47.

FIG. 13 is a chart representing results of bending strength tests forthe chip of FIG. 12. In the chart, the conventional chip indicates achip obtained by conventional laser processing, specifically, one inwhich three rows of modified regions each continuously formed from theleft end part to the right end part in each side face of the chip alignin the thickness direction.

These bending strength tests measured the strength in a three-point bendscheme, i.e., the strength at the time when a force was applied with ablade or the like to the chip C1 held by both ends thereof. Employed asa testing machine was Autograph AG-IS (manufactured by ShimadzuCorporation) with a span of 2 mm between blade points. The strength atwhich the surface (i.e., rear face 21) opposite to the entrance surfaceopened when a force was applied from the laser light entrance surface(i.e., front face 3) side is represented where “the open surface is therear face,” while the strength at which the entrance surface side openedwhen a force was applied from the rear face side is represented where“the open surface is the entrance surface.”

As FIG. 13 illustrates, it is seen that this embodiment allows the chipC1 to have a bending strength higher than that of the conventional chip.Here, the average value of bending strength is enhanced by 3 times ormore and 1.5 times or more when the open surface is the rear face andentrance surface, respectively.

The modified region 17 on the rear face 21 side and the modified region47 on the front face 3 side seem to effectively contribute to improvingthe bending strength when the open surface is the rear face and entrancesurface, respectively. The bending strength has also been seen to becomehigher in the chip C1 having a thickness of 300 μm than in theconventional chip as a result of the above-mentioned bending strengthtests applied thereto.

In the foregoing, one of the rear and front faces 21, 3 constitutes “onemain face,” while the other does “the other main face.” One of themodified regions 17, 47 constitutes “the first modified region,” whilethe other does “the second modified region.” The modified regions 27, 37constitute “the third modified region.”

Second Embodiment

The second embodiment of the present invention will now be explained.This embodiment will be explained mainly in terms of differences fromthe above-mentioned first embodiment.

As FIG. 14 illustrates, an object 61 to be processed by the laserprocessing method of this embodiment has the front face 3 formed with aplurality of functional devices 65. The functional devices 65, eachhaving an elongated rectangular form, are arranged in such a matrix asto have the same longitudinal direction,

First, as illustrated in FIG. 15( a), the laser processing method ofthis embodiment mounts the object 61 having a BG tape 62 attached to itsfront face 3 side onto the support table 107 (see FIG. 1).

Subsequently, while irradiating the object 61 such that its rear face 21serves as a laser light entrance surface, the laser light L isrelatively moved along lines to cut 5 a extending in the lateraldirection of the functional devices 65. This step is repeatedlyperformed while changing the position of the converging point P. Thisforms three rows of modified regions 57 (57 ₁, 57 ₂, 57 ₃), which extendalong the lines 5 and align in the thickness direction, in this orderfrom the rear face 21 side to the front face 3 side as illustrated inFIG. 8( b).

The modified regions 57 ₁, 57 ₂, 57 ₃ are formed such as to be locatedon the front face 3 side of the object 61, at substantially the centerin the thickness direction thereof, and on the rear face 21 sidethereof, respectively. The modified regions 57 ₁, 57 ₂, 57 ₃ arecontinuously formed so as to exist from one end side of the object 61 tothe other end side thereof in the direction along the lines 5 a.

Next, while irradiating the object 61 such that the converging point Pis located on the front face 3 side, the laser light L is relativelymoved along lines to cut 5 b extending in the longitudinal direction ofthe functional devices 65. This forms modified regions 67 located on thefront face 3 side of the object 61 within the object 61 along the lines5 b as illustrated in FIG. 16( a). Here, the laser light sourcecontroller 102 regulates the ON/OFF of the emission of the laser lightL, so as to form the modified regions 67 such that modified regionformed parts 67 a which are parts formed with the modified regions 67and modified region unformed parts 67 b which are parts formed withoutthe modified regions 67 alternate along the lines 5 b.

More specifically, when the object 61 is seen from a lateral side, themodified region formed parts 67 a are formed so as to exist in partscorresponding to between a plurality of functional devices 65, while themodified region unformed parts 67 b are formed so as to exist in partscorresponding to the center parts of the functional devices 65.

Subsequently, while irradiating the object 61 such that the convergingpoint P is located at substantially the center in the thicknessdirection of the object 61, the laser light L is relatively moved alongthe lines 5 b. This continuously forms modified regions 77 (modifiedregion formed parts 77 a) located at substantially the center in thethickness direction of the object 61 such that they exist from one endside of the object 61 to the other end side thereof in the directionalong the lines 5 b.

Next, while irradiating the object 61 such that the converging point Pis located on the rear face 21 side of the object 61, the laser light Lis relatively moved. This forms modified regions 87 located on the frontface 3 side of the object 61 within the object 61 along the lines 5 b asillustrated in FIG. 16( c). The modified regions 87 are formed like theabove-mentioned modified regions 67 such that modified region formedparts 87 a which are parts formed with the modified regions 87 andmodified region unformed parts 87 b which are parts formed without themodified regions 87 alternate along the lines 5 b.

Subsequently, an expandable tape 22 is attached and transferred to therear face 21 of the object 61 as illustrated in FIG. 17 and thenexpanded as illustrated in FIG. 18, so as to cut the object 61 into thefunctional devices 65 along the lines 5 from the modified regions 57,67, 77, 87 acting as cutting start points. This yields a plurality ofsemiconductor chips C2.

FIG. 19 is a perspective view illustrating a chip obtained by the laserprocessing method of this embodiment. As illustrated in FIG. 19, thechip C2 presents an oblong form when seen from the front face 3 and hasthe functional device 15 formed on the front face 3. In each of sidefaces 63 a extending along the lateral direction of the chip C2, threerows of modified regions 57 ₁, 57 ₂, 57 ₃ aligning in the thicknessdirection are formed in this order from the front face 3 side to therear face 21 side. Each of the modified regions 57 ₁, 57 ₂, 57 ₃ extendsalong the orthogonal direction in the side face 63 a.

The modified regions 57 ₁, 57 ₂, 57 ₃ are formed such as to be locatedon the front face 3 side of the side face 63 a, substantially at thecenter in the thickness direction thereof, and on the front face 21 sidethereof, respectively. The modified regions 57 ₁, 57 ₂, 57 ₃ are formedcontinuously so as to exist from one end side of the side face 63 a tothe other end side thereof in the orthogonal direction.

In each of side faces 63 b extending along the longitudinal direction ofthe chip C2, three rows of modified regions 67, 77, 87 aligning in thethickness direction are formed in this order from the front face 3 sideto the rear face 21 side. The modified regions 67, 87 are locatedclosest to the front and rear faces 3, 21, respectively. The modifiedregions 67, 87 are formed in left and right end parts in the orthogonaldirection in each side face 63 b which are etch parts of the chip C2.The modified regions 67, 87 here are provided only in partscorresponding to areas which are free of the functional devices 65 inthe front face 3 when seen from the side face 63 b. That is, the partscorresponding to the areas provided with the functional devices 65 inthe front face 3 are formed with none of the modified regions 67, 87.The modified region 77 is located between the modified regions 67, 87and formed continuously from the left end part of the chip C2 to theright end part thereof in the orthogonal direction in each side face 63b.

As in the foregoing, this embodiment exhibits an effect similar to thatmentioned above, i.e., the effect of reliably cutting the object 61 andimproving the strength of the chips C2 obtained by cutting.

When the functional devices 65 are elongated, so that the chips C2obtained by cutting have an elongated form as in this embodiment, thechips C2 are required to improve the strength in their longitudinaldirection in particular. In this regard, alternating the modified regionformed parts 67 a, 87 a with the modified region unformed parts 67 b, 87b along the longitudinal lines 5 b can enhance the bending strength inthe longitudinal direction in particular, whereby the above-mentionedeffect of improving the strength of the chips C2 can be exhibitedeffectively.

In the foregoing, one of the modified regions 87 and 67 constitutes “thefirst modified region,” while the other does “the second modifiedregion.” The modified region 77 constitutes “the third modified region.”

Though preferred embodiments of the present invention have beenexplained in the foregoing, the present invention is not limitedthereto. For example, while the above-mentioned first embodiment employsfront illumination in which the laser light L is incident on the frontface 3 serving as the laser light illumination surface, backillumination in which the laser light L is incident on the rear face 21serving as the laser light illumination surface may be used. Theabove-mentioned second embodiment may employ the front illumination inplace of the back illumination.

While the above-mentioned first embodiment forms the modified regions17, 27, 37, 47 in this order, and the second embodiment does themodified regions 57, 67, 87 in this order, the modified regions can beformed in any desirable order without restriction.

The modified region formed and unformed parts may be formed not only bycontrolling the ON/OFF of the emission of the laser light L as in theabove-mentioned embodiments, but also by opening/closing a shutterdisposed on an optical path of the laser light L or masking the frontface 3 of the object 1, for example. The modified region formed andunformed parts may also be formed by controlling the laser light Lbetween an intensity at a threshold (processing threshold) or higher andan intensity lower than the processing threshold.

INDUSTRIAL APPLICABILITY

The present invention can reliably cut an object to be processed andimprove the strength of the resulting chips.

REFERENCE SIGNS LIST

1, 61 . . . object to be processed; 3 . . . front face; 5, 5 a, 5 b . .. line to cut; 7, 17, 27, 37, 47, 57, 67, 77, 87 . . . modified region;15, 65 . . . functional device; 17 a, 27 a, 37 a, 47 a, 67 a, 77 a, 87 a. . . modified region formed part; 17 b, 47 b, 67 b, 87 b . . . modifiedregion unformed part; 21 . . . rear face; 51, 63 b . . . side face; C1,C2 . . . chip; L . . . laser light; P . . . converging point; S . . .surface to cut

The invention claimed is:
 1. A chip having side faces substantiallyparallel to a thickness direction, and having first and second mainfaces substantially perpendicular to the thickness direction; wherein atleast one of the side faces is formed with first, second, and thirdmodified regions aligning in the thickness direction and extending in adirection intersecting the thickness direction; wherein on the at leastone side face, the first modified region is formed on a first line thatextends in the intersecting direction from one end to an opposing end ofthe at least one side face and is adjacent to the first main face, thefirst modified region located at the one end and at the opposing end;wherein on the at least one side face, the second modified region isformed on a second line that extends in the intersecting direction fromthe one end to the opposing end of the at least one side face and isadjacent to the second main face, the second modified region located atthe one end and at the opposing end; and wherein on the at least oneside face, the third modified region is located between the first andsecond lines and formed to extend from the one end to the opposing endof the at least one side face, and wherein on the at least one sideface, the first modified region is not formed in an area between the oneend and the opposing end and the second modified region is not formed inan area between the one end and the opposing end.
 2. A chip according toclaim 1, wherein an area covered by the first modified region and thesecond modified region on the at least one side face is smaller than anarea covered by the third modified region on the at least one side face.